• Super-high-speed testing at up to 100 points/sec • 30% faster cycle times for gold plating and fine pattern testing • By combining newly designed probes CP1072-01 and new soft-landing control, the FA1116-03 makes it possible to approach the maximum speed setting during fine pattern testing. • High resolution of 5 aF to ensure reliable detection of minute changes in capacitance caused by defects (1 aF = 10^-6 pF) • Support for boards ranging from standard bare boards to flexible boards, BGAs, CSPs, MCMs, and other high-density boards • Reliable probing of fine-pitch minute pads thanks to a minimum pad diameter of 15 μm • Support for resistance, inductance, diode, and voltage measurement in addition to capacitance measurement. MLCC(Multi-Layer Ceramic Capacitor) Measurement mode allows JIS-compliant measured value acquisition. • Extensive measurement functions and optional units reduce backlogs of untested boards.
The Flying Probe Tester FA1116-03 is a high-speed automatic board tester that uses newly developed low-impact probes and precision soft-landing control to achieve 30% faster cycle times for gold plating and fine pattern testing than legacy products.
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