• 100 kHz to 300 MHz testing source frequency • Fastest test speed of 0.5 msec (Analog measurement time) • ±0.72% rdg. basic accuracy • Compact, half-rack footprint with space-saving test head • Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment) • Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode
Hioki LCR and Impedance Analyzers range from 1mHz to 1.3GHz devices to suit a wide range of applications in the testing of electronic components. The IM7581 offers a top measurement time of 0.5ms over a 100kHz to 300MHz frequency range, making it ideal for high volume production of ferrite chip beads and chip inductors.
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